RPI Engineering
Robert Hull

Robert Hull

Henry Burlage Jr. Professor of Engineering and Director of Center for Materials, Devices, and Integrated Systems

Nanotechnology, Electronic Materials, Semiconductors

Hull joined RPI in January 2008 to assume the positions of the Head of the Materials Science and Engineering Department and the Henry Burlage Professor of Engineering. Prior to that he spent about a decade at Bell Laboratories in the Physics Research Division, and twelve years at the University of Virginia, where he was the Director of an NSF MRSEC Center and Director of the UVA Institute for Nanoscale and Quantum Science. He received his PhD in Materials Science from Oxford University in 1983. Hull is highly active in engineering and materials science societies and professional groups. He is a fellow of the American Physical Society and of the Materials Research Society, and in 1997 served as president of the Materials Research Society. He has also chaired a Gordon Research Conference on Thin Films, and chaired the Committee of Visitors for the National Science Foundation’s Division of Materials Research. Within the realms of materials and nanoscience, Hull’s research focuses on the relationships between structure and property in electronic materials, fundamental mechanisms of thin film growth, and the self-assembly of nanoscale structures. Other areas of interest include degradation modes in electronic and optoelectronic devices, the properties of dislocations in semiconductors, nanoscale fabrication techniques, nanoscale tomographic reconstruction techniques, development of new nanoelectronic architectures, and the theory and application of electron and ion beams.



Ph.D., Oxford University Department of Metallurgy and Materials Science; B.A., Oxford University Physics


  • “Control of Semiconductor Quantum Dot Nanostructures: Variants of SixGe1-x/Si Quantum Dot Molecules”. J. Murphy*, R. Hull, D. Pyle, H. Wang, J. Gray and J. Floro, J. Vac. Sci. Technol 22, 075301:1-5 (2011)
  • “Quantification of Electron-Phonon Scattering for High Spatial Resolution Temperature Measurement in the Transmission Electron Microscope”, L. He and R. Hull, Nanotechnology 23, 205705:1- (2012)
  • "A novel nano-scale non-contact temperature measurement technique for crystalline materials", X. Wu and R. Hull, Nanotechnology 23, (2012)
  • "Examination of ion-induced Auger electron spectra of Ti, Cr and Co in a mass-selecting Focused Ion Beam with a gold-silicon liquid metal ion source", H. Parveneh and R. Hull, Vacuum 110, 69-73 (2014)
  • "Nanoscale chemistry of self-assembled nanostructures in epitaxial SiGe growth", P. Balasubramanian, J.A. Floro, J.L. Gray and R. Hull, J. Cryst. Growth 400, 15-20 (2014)