Imaging the Properties of Atoms and Fields down to the Picometer Scale inside Materials and Devices
With recent advances in detector technology and a new class of ptychographic phase-retrieval algorithms to unscramble multiple scattering, the resolution of the electron microscope is now limited only by the dose applied to the sample, and thermal vibrations of the atoms themselves. At high doses, these approaches have allowed us to image the detailed vibrational envelopes of individual atom columns as well as locating individual interstitial atoms.
