Impact of Point Defects on Efficiency of Devices
Point defects may act as compensating centers, charge traps, or radiative or nonradiative recombination centers. In addition, unintentional impurities often play an equally detrimental role; for instance, carbon that is unavoidably incorporated during growth can act as a recombination center in nitrides, or as a charge trap in oxide dielectrics. Theoretical advances now enable us to calculate the electronic and optical properties as well as radiative and nonradiative carrier capture coefficients with unprecedented accuracy.
