Electron microscopy enables the study of micro and nano-scale structures of materials along with high resolution imaging and elemental analysis. This facility includes equipment for transmission electron microscopy (TEM), scanning electron microscopy (SEM) including electron back-scattering diffraction (EBSD) for elemental analysis, Raman spectroscopy and sample preparation.
Facility is open to TRAINED operators 24 hrs per day , 7 days per week , 365 days per year unless building closed for maintenance.
The lab is available to RPI Faculty, Students, Staff and external users (on individual basis with review by lab mgr and/or chair). All usage of associated sample preparation equipment, on site, is at no charge (excluding expendables).
![JEOL JSM-6335 FESEM](/sites/default/files/images-equipment/EML-JEOL-JSM-6335.jpg)
SE, BSE, CL, EDS Detectors; Cold Cathode; 4.5 nm resolution
![Renishaw Raman Spectrometer](/sites/default/files/images-equipment/EML-Renishaw-Raman-Spectrometer.jpg)
405nm, 514nm, 785nm lasers Hot/Cold Stage; Liquid Cell
![JEOL JEM–2011 TEM](/sites/default/files/images-equipment/EML-JEOL-JEM-2011.jpg)
AMT xr280 CMOS Camera, LaB6 Cathode, 200 KV, 0.23 nm point to point and 0.14 nm lattice resolution
![Sample prep equipment in EML](/sites/default/files/images-equipment/EML-SamplePrep.jpg)
![TEM Images Example](/sites/default/files/inline-images/EML-TEM-Images-Example.jpg)
![EML EDS with SEM](/sites/default/files/inline-images/EML-EDS-with-SEM-Example.jpg)
![TEM Diffraction Example](/sites/default/files/inline-images/EML-TEM-Diffraction-Example.jpg)